NEWS

Werth Knowing

From Clinical CT to Industrial Measuring Machine

X-ray tomography, also known as computed tomography (CT), can be used to completely capture spatially extensive objects, including their internal structures for metrology purposes. The Austrian mathematician Johann Radon (1887–1956) laid the mathematical foundation for this process in the beginning […]

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Events

Visit the Werth Booth#3241 Where Manufacturing Minds Meet from February 6-8, 2018

The Werth Team will introduce and demonstrate the new Werth TomoScope XS during the Pacific Design and Manufacturing Show at the Anaheim Convention Center. Do not miss your opportunity to see this BIG TECHNOLOGY in a small box. Talk to […]

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Press Release

With High Speed and Accuracy

Topographic Scanning with the New Chromatic Focus Line Sensor Multidimensional distance sensors enable high point densities and measuring speeds.  Often, however, this comes at a cost of increased measurement uncertainty. Learn more about the new CFL Chromatic Focus Line Sensor. […]

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Press Release

The Multisensor Advantage

Modern coordinate measuring technology has an optimal sensor for virtually any measurement task. Different measurement tasks on the same workpiece can usually be handled most efficiently with a multisensor coordinate measuring machine. Learn more about the Multisensor Advantage.

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Events

Werth TomoScope XS

The new Werth TomoScope XS has been delivered to our Demo Center in Old Saybrook, Connecticut. It is currently being installed and will be presented to customers starting Monday, January, 8th 2018. Make your appointment today to see BIG TECHNOLOGY  […]

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