The Chromatic Focus Line sensor provides another interesting function: in addition to the wavelength of the reflected light, its intensity is also analyzed and a raster image of the work piece surface is generated. Subsequent analysis with image processing software allows measurement “in the image” of geometric features or definition of the work piece coordinate system. The positions for measurements with a variety of other sensors are determined on this basis, without requiring a sensor change. With the unparalleled accuracy of the CFL at high measuring speed, precision components and micro features are measured. The sensor can be used on highly reflective or transparent work pieces, such as die stamps and carbide or diamond tools, but also on diffuse reflective plastic components. The high point density allows the determination of topography for a wide variety of surfaces to be captured, such as precision mechanical work pieces like watch chassis plates. With in-process measurement of LED array coplanarity, semiconductor technology is another typical area of application for the CFL. The measurement result is the entire shape of the work piece surface in the form of a point cloud, which can be used to determine flatness or roughness and to measure geometric elements. A nominal to actual comparison with color coded deviation plots is also possible.