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Werth Image Processing IP

Werth Image Processing IP

Autofocus sensor

Autofocus sensor

Werth Laser Probe WLP

Werth Laser Probe WLP

Chromatic Focus Point Sensor CFP

Chromatic Focus Point Sensor CFP

Chromatic Focus Zoom CFZ

Chromatic Focus Zoom CFZ

Chromatic Focus Line Sensor CFL

Chromatic Focus Line Sensor CFL

Werth 3D Patch

Werth 3D Patch

Nano Focus Probe NFP

Nano Focus Probe NFP

Werth Interferometer Probe WIP

Werth Interferometer Probe WIP

Laser Line Probe LLP

Laser Line Probe LLP

Optical

The benefits of non-contact metrology lie in non-contact measurement. This means that both sensitive workpieces and those with small features can be measured. Non-contact measurement eliminates the need for time-consuming set-up, which is difficult with small or elastic workpieces.

Werth Image Processing IP

Werth Image Processing IP

Autofocus sensor

Autofocus sensor

Werth Laser Probe WLP

Werth Laser Probe WLP

Chromatic Focus Point Sensor CFP

Chromatic Focus Point Sensor CFP

Chromatic Focus Zoom CFZ

Chromatic Focus Zoom CFZ

Chromatic Focus Line Sensor CFL

Chromatic Focus Line Sensor CFL

Werth 3D Patch

Werth 3D Patch

Nano Focus Probe NFP

Nano Focus Probe NFP

Werth Interferometer Probe WIP

Werth Interferometer Probe WIP

Laser Line Probe LLP

Laser Line Probe LLP

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