Other geometric artifacts arise from scattered radiation, the orientation of the rotary axis in the image, and other effects (Fig. 42). Analytical capture and correction of these complex interrelationships is barely possible at the moment, considering that the associated parameters are only partially known or completely unknown. This also applies to the part geometry, the material density, and the exact X-ray spectrum. Through integration of additional tactile or optical sensors, these systematic measurement deviations can be measured with sufficient precision and corrected. This measurement must be carried out only once for each type of measured object and only at a few relevant points. The correction data are stored in the measurement program and are used again for new measurements of the same object type.