When the X-rays are attenuated in the material, due to Compton scattering, incident X- ray photons are deflected (scattered) from their original direction of travel by electrons of the penetrated material and are therefore subject to a loss of energy (Compton Effect).  Due to Compton scattering, some X-rays propagate in different directions. In addition to the desired effect of attenuating the radiation in the direction of measurement, there is an increase in brightness in other areas of the work piece. Multiple scattering within a work- piece can give rise to a type of background radiation that acts as an offset to the usable radiation intensities, and thus can lead to measurement errors known as scattered radiation artifacts.  Because the size and distribution of the scattered radiation directly depends on the material and the geometry, only a work piece related correction is possible. This is done implicitly, to a degree, with the beam hardening correction. The scattered radiation effect can be minimized by properly setting up the tube voltage and selecting beam hardening filters. However, in many cases the measurement errors caused by scattered radiation are negligibly small, so that a correction is not needed.