In a measuring probing system, the sensor is equipped with path measuring systems (scales, inductive sensors, optical measuring systems, etc.), usually in all three coordinate axes. If, upon contacting the workpiece, the stylus sphere is deflected in any direction, the magnitude of this deflection can be read off from the path measuring system . The measured point is generated by superimposing the sensor coordinates over the coordinates of the coordinate measuring machine (similar to “measuring on the image”). The stylus sphere correction corresponding to the vector position of the surface being probed described above and the elastic deflection of the stylus are then also taken into account.