Technology Day at the Giessen headquarters

With participants from all over Germany, the Giessen Technology Day on December 4 was, as always, very well attended. The user reports from industry on the topics of "Fast & efficient processing using CT" and "Use of tomography scans at Faber-Castell" were presented by Thomas Lender, toolcraft AG, and Sebastian Spörl, Faber-Castell Cosmetics, respectively. Prof. Dr.-Ing. Teresa Werner from the West Saxon University of Applied Sciences in Zwickau provided information on "The new general tolerances according to ISO 22081 and DIN 2769". Werth president Dr.-Ing. habil. Ralf Christoph welcomed the guests and presented current trends in coordinate metrology.

In 1987, Maria Werth, the widow of the company founder, established the Dr.-Ing. Siegfried Werth Foundation to promote and finance scientific work in the field of non-contact metrology. This year, at the suggestion of Prof. Dr.-Ing. habil. Jürgen Czarske from the TU Dresden, the bachelor thesis by Jie Zhang and the dissertation by Dr. Julian Lich were awarded. The laudatory speech was held by Dr. Robert Kuschmierz.

The program was rounded off by tours and the solution of individual measurement tasks by Werth specialists. The series of events for next year with technology days in Germany, Austria and Switzerland is already being planned – We will keep you up to date with our newsletter.