Technology Day in Giessen

The Werth Technology Days take place every year at selected locations in German-speaking countries in close cooperation with universities, institutes and cooperation partners from industry. The final event in Giessen was very well attended. The presentations by selected customers covered the use of our TomoScope® coordinate measuring systems in geobiodiversity research, quality assurance of small injection molding parts and the re-engineering of dental implants.
Prof. Dr.-Ing. Gabriel Herl from the Deggendorf Institute of Technology and Dr. rer. nat. Philip Trapp from the German Cancer Research Center in Heidelberg were awarded the Dr.-Ing. Siegfried Werth Prize for their outstanding dissertations in the field of non-contact metrology. The company tours, during which the assembly and commissioning of the measuring machines were explained, once again met with great interest.