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Werth Technology Days Giessen on December 04, 2024

Werth Technology Days Giessen on December 04, 2024

Werth Technology Days with exclusive lectures from industry and science on multi-sensor systems and computed tomography

Dear ladies and gentlemen,

We cordially invite you to the Werth Technology Day in Giessen on 04 December 2024.
Exclusive presentations from industry and science will provide insights into the technology of multi-sensor systems and computed tomography.
Take advantage of the opportunity to carry out test measurements on your workpieces, discuss special requirements with our experts and optimize your metrology. We also offer our device users the opportunity to get to know new hardware and software options.

Program:

04.12.2024
Werth Technology Day Giessen

At our headquarters:
Werth Messtechnik GmbH
Siemensstraße 19
35394 Giessen

09:00 – 09:15
Welcome by the host
Dr.-Ing. habil. Ralf Christoph, owner and president, Werth Messtechnik GmbH, Giessen

09:15 – 09:45
Fast & efficient machining using CT – Pacemaker for high-end precision components
Thomas Lender, Head of Injection Molding, toolcraft AG, Spalt

09:45 – 10:15
The new general tolerances according to ISO 22081 and DIN 2769
Prof. Dr.-Ing. Teresa Werner, Institute for Production Technology, West Saxon University of Applied Sciences Zwickau

10:15 – 10:45
Coffee break and discussion

10:45 – 11:15
Werth coordinate metrology with multi-sensor systems and CT – Scale for fast and accurate measurements
Andreas Flechtmann, Sales Manager D/A/CH, Werth Messtechnik GmbH, Giessen

11:15 – 12:00
Promotion of young talent by the Dr.-Ing. Siegfried Werth Foundation – Awards for scientific work in the field of industrial metrology
Dr.-Ing. Bernd-Jochen Schniewind, Chairman of the Board of Trustees, Dr.-Ing. Siegfried Werth Foundation, Giessen

12:00 – 12:30 p.m.
So that the pin gets to the point – Use of tomography scans at Faber-Castell
Sebastian Spörl, Quality Assurance CQG, A.W. Faber-Castell Cosmetics GmbH, Geroldsgrün

12:30 – 13:30
Lunch break and discussion

13:30 – 17:00
Individual advice for our users on expansion and upgrade options for existing devices

13:30 – 17:00
Individual test measurements with multi-sensor systems and computed tomography on your workpieces

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