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Glossary W

Terms relating to coordinate metrology with optics, probe, computed tomography and multi-sensor systems

Wafer measurement

See: 3D coordinate measuring machine

Werth Messtechnik GmbH

Werth concentrates on the development, manufacture and sale of coordinate measuring systems(coordinate measuring machines) with optics, probe, computed tomography and multi-sensor systems and for the measurement of micro-features. The worldwide technology leadership in these market segments is reflected in a number of world firsts and patents on instrument technology and sensors.

White light interferometer

See: interferometric sensor

White light sensor

See: chromatic sensor

Workshop microscope

See: Measuring microscope
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